Maud

Overview

MAUD is a free Rietveld extended program to perform the combined analysis. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons.

Version 2.93 is available on the iCSF.

Restrictions on use

All users may access and use Maud. Please review the license and ensure the software is only used in accordance with the terms of the license agreement.

For citation information see the MAUD License Page.

Set up procedure

To use the software you will need to load the modulefile:

module load apps/binapps/maud/2.93

Running the application

Examples

• To open the program run the following command

  maud.sh
  

Further info

• Maud General Usage